Description

• Materialographic preparation and examination for optical microscopy and Scanning Electron Microscopy (SEM).
• Precision dissection of materials.
• Operations associated with preparation for Transmission Electron Microscopy (TEM).
• Observation of materials with binocular loupes and optical microscopes and image acquisition.
• Measurement of thicknesses with micrometric precision apparatus.
• Mechanical milling of materials by means of automatic and semi-automatic systems.
• Cutting of 3mm diameter cylinders with ultrasonic cutter.
• Concave-convex milling of the center of 3 mm diameter cylinders.
• Final milling of materials to electron-transparency.
• Hydrocarbon reduction treatment in TEM microscopy sample holder (Plasma Cleaner).
• Coating operations using impregnation, evaporation and sputtering.
• Developing or digitizing TEM micrographs.

Lines of research

• Structural and chemical characterization of nanostructured materials using advanced Electron Microscopy techniques, in particular materials for Heterogeneous Catalysis.
• Development of nanomaterial characterization methodologies using Electron Microscopy.
• Atomic-scale characterization of functional nanoparticles.
• Engineering of GaAsSbN semiconductor alloys for applications in high performance photodetectors and solar cells.
• Characterization and assessment of semiconductor nanowires for micro-and opto-electronic applications using electron microscopy techniques.
• Multiple systems of thin layers and nanostructures based on the activity of binary (InN, AlN, GaN), ternary (InAlN, InGaN, algae) and quaternary (Inalgae) III-N nitrides for optoelectronics, power electronics and photovoltaic technology.
• Synthetic diamond for material engineering.
• Reinforced polymers for aeronautics.
• Nanoanalysis and nanoprocessing of materials: using electron nanoscopy and focused ion beams.

Infrastructures

• Diamond thread cutter (Well Precision Model 3242).
• Ionic milling machine (Fischione 1050).
• Ionic milling machine (Fischione 1010).
• 2 ionic milling machines (PIPS 691 GATAN).
• Rotopol 35 (Struers) automatic grinding machine with articulated arm, Labopol 25 (Struers) grinding/polishing machine.
• Labopol-5 (Struers) polisher.
• Tenupol-5 (Struers) polisher.
• Minimet 1000 (Buehler) polisher.
• Plasma cleaner model 1020 (Fischione).
• Pump station to evacuate sample holder, model 9020 (Fischione).
• 2 Disc Grinders (623-GATAN).
• 2 Dimple Grinders (656-GATAN).
• Ultrasonic Cutter (601-GATAN).
• Disc Punch (659-GATAN).
• Trinocular Stereoscopic Microscope (SMZ745T-NIKON), High Resolution Sputter Coater (208HR-Cressington).
• Metallographic press (Citopress-1, Struers).
• Inverted metallographic microscope (MA-100- Nikon).
• Digital Camera (Infinity1-3C-Lumenera).
• DITABIS Scanner and set of 40 electronic plates.
• Accutom-5 (Struers) disc cutter.
• Ultramicrotome (Reihert-Jung).

Contact

Facultad de Ciencias
11510, Campus de Puerto Real, Cádiz
fmiguel.morales@uca.es (Responsable división)
salvador.catalan@uca.es (Técnico división)
https://sccyt.uca.es